Publication:
A stochastic integral equation method for modeling the rough surface effect on interconnect capacitance

Placeholder

School / College / Institute

Program

KU-Authors

KU Authors

Co-Authors

Zhu, Zhenhai
White, Jacob

Publication Date

Language

Embargo Status

Journal Title

Journal ISSN

Volume Title

Alternative Title

Abstract

In this paper we describe a stochastic integral equation method for computing the mean value and the variance of capacitance of interconnects with random surface roughness. An ensemble average Green's function is combined with a matrix Neumann expansion to compute nominal capacitance and its variance. This method avoids the time-consuming Monte Carlo simulations and the discretization of rough surfaces. Numerical experiments show that the results of the new method agree very well with Monte Carlo simulation results. © 2004 IEEE.

Source

Publisher

IEEE-Inst Electrical Electronics Engineers Inc

Subject

Electrical and electronics engineering

Citation

Has Part

Source

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Book Series Title

Edition

DOI

10.1109/ICCAD.2004.1382699

item.page.datauri

Link

Rights

Copyrights Note

Endorsement

Review

Supplemented By

Referenced By

0

Views

0

Downloads

View PlumX Details