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A stochastic integral equation method for modeling the rough surface effect on interconnect capacitance

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dc.contributor.coauthorZhu, Zhenhai
dc.contributor.coauthorWhite, Jacob
dc.contributor.departmentDepartment of Electrical and Electronics Engineering
dc.contributor.kuauthorDemir, Alper
dc.contributor.schoolcollegeinstituteCollege of Engineering
dc.date.accessioned2024-11-09T23:50:09Z
dc.date.issued2004
dc.description.abstractIn this paper we describe a stochastic integral equation method for computing the mean value and the variance of capacitance of interconnects with random surface roughness. An ensemble average Green's function is combined with a matrix Neumann expansion to compute nominal capacitance and its variance. This method avoids the time-consuming Monte Carlo simulations and the discretization of rough surfaces. Numerical experiments show that the results of the new method agree very well with Monte Carlo simulation results. © 2004 IEEE.
dc.description.fulltextNo
dc.description.harvestedfromManual
dc.description.indexedbyScopus
dc.description.indexedbyWOS
dc.description.openaccessYES
dc.description.peerreviewstatusN/A
dc.description.publisherscopeInternational
dc.description.readpublishN/A
dc.description.sponsoredbyTubitakEuN/A
dc.description.sponsorshipIEEE
dc.description.sponsorshipIEEE CASS/CANDE
dc.description.sponsorshipIEEE Computer Society
dc.description.sponsorshipACM SIGDA
dc.description.sponsorshipIEEE Electron Devices Society, EDS
dc.description.versionN/A
dc.identifier.doi10.1109/ICCAD.2004.1382699
dc.identifier.embargoN/A
dc.identifier.isbn0780-3870-23
dc.identifier.issn1092-3152
dc.identifier.quartileBakılacak
dc.identifier.scopus2-s2.0-16244375540
dc.identifier.urihttps://doi.org/10.1109/ICCAD.2004.1382699
dc.identifier.urihttps://hdl.handle.net/20.500.14288/14484
dc.keywordsGaussian distribution
dc.keywordsRough surface
dc.keywordsSpatial correlation
dc.keywordsStandard deviation
dc.keywordsComputer simulation
dc.keywordsCorrelation methods
dc.keywordsFunctions
dc.keywordsInterconnection networks
dc.keywordsMathematical models
dc.keywordsMonte Carlo methods
dc.keywordsRandom processes
dc.keywordsStatistical methods
dc.keywordsSurface roughness
dc.keywordsCapacitance
dc.language.isoeng
dc.publisherIEEE-Inst Electrical Electronics Engineers Inc
dc.relation.affiliationKoç University
dc.relation.collectionKoç University Institutional Repository
dc.relation.ispartofIEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
dc.relation.openaccessN/A
dc.rightsN/A
dc.subjectElectrical and electronics engineering
dc.titleA stochastic integral equation method for modeling the rough surface effect on interconnect capacitance
dc.typeConference Proceeding
dspace.entity.typePublication
local.contributor.kuauthorDemir, Alper
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