Publication: Two-wavelength grating interferometry for extended range MEMS metrology
dc.contributor.department | Department of Electrical and Electronics Engineering | |
dc.contributor.department | Graduate School of Sciences and Engineering | |
dc.contributor.kuauthor | Ferhanoğlu, Onur | |
dc.contributor.kuauthor | Toy, Muhammed Fatih | |
dc.contributor.kuauthor | Ürey, Hakan | |
dc.contributor.schoolcollegeinstitute | College of Engineering | |
dc.contributor.schoolcollegeinstitute | GRADUATE SCHOOL OF SCIENCES AND ENGINEERING | |
dc.date.accessioned | 2024-11-09T22:57:08Z | |
dc.date.issued | 2007 | |
dc.description.abstract | Diffraction gratings integrated with MEMS has many applications as they can offer shot noise limited sub-nm displacement detection sensitivities but are limited in range. a two-wavelength readout method is developed that maintains high sensitivity while increasing the detection range from 105nm to 1.7um assuming sensitivity is maintained at > 50% of the maximum sensitivity. | |
dc.description.indexedby | WOS | |
dc.description.indexedby | Scopus | |
dc.description.openaccess | NO | |
dc.description.publisherscope | International | |
dc.description.sponsoredbyTubitakEu | N/A | |
dc.identifier.doi | 10.1109/OMEMS.2007.4373857 | |
dc.identifier.isbn | 978-1-4244-0641-8 | |
dc.identifier.quartile | N/A | |
dc.identifier.scopus | 2-s2.0-48049107498 | |
dc.identifier.uri | https://doi.org/10.1109/OMEMS.2007.4373857 | |
dc.identifier.uri | https://hdl.handle.net/20.500.14288/7498 | |
dc.identifier.wos | 251224200048 | |
dc.keywords | Optical sensing | |
dc.keywords | Grating interferometry | |
dc.keywords | MEMS metrology | |
dc.language.iso | eng | |
dc.publisher | IEEE | |
dc.relation.ispartof | 2007 IEEE/Leos International Conference on Optical Mems and Nanophotonics | |
dc.subject | Electrical electronics engineering | |
dc.subject | Nanoscience | |
dc.subject | Nanotechnology | |
dc.subject | Optics | |
dc.subject | Spectrum analysis | |
dc.title | Two-wavelength grating interferometry for extended range MEMS metrology | |
dc.type | Conference Proceeding | |
dspace.entity.type | Publication | |
local.contributor.kuauthor | Toy, Muhammed Fatih | |
local.contributor.kuauthor | Ferhanoğlu, Onur | |
local.contributor.kuauthor | Ürey, Hakan | |
local.publication.orgunit1 | GRADUATE SCHOOL OF SCIENCES AND ENGINEERING | |
local.publication.orgunit1 | College of Engineering | |
local.publication.orgunit2 | Department of Electrical and Electronics Engineering | |
local.publication.orgunit2 | Graduate School of Sciences and Engineering | |
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