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Near-infrared resonant cavity enhanced silicon microsphere photodetector

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dc.contributor.coauthorMurib, Mohammed Sharif
dc.contributor.coauthorYüce, Emre
dc.contributor.coauthorGürlü, Oğuzhan
dc.contributor.departmentDepartment of Physics
dc.contributor.kuauthorSerpengüzel, Ali
dc.contributor.schoolcollegeinstituteCollege of Sciences
dc.date.accessioned2024-11-09T13:10:42Z
dc.date.issued2009
dc.description.abstractElastic scattering intensity calculations at 90° and 0° for the transverse electric and transverse magnetic polarized light were performed at 1200nm for a 50 μm radius and 3.5 refractive index silicon microsphere. The mode spacing between morphology dependent resonances was found to be 1.76 nm. The linewidth of the morphology dependent resonances was observed to be 0.02 nm, which leads to a quality factor on the order of 104.
dc.description.fulltextYES
dc.description.indexedbyWOS
dc.description.indexedbyScopus
dc.description.openaccessYES
dc.description.publisherscopeInternational
dc.description.sponsoredbyTubitakEuEU - TÜBİTAK
dc.description.sponsorshipEuropean Commission Project (EC)
dc.description.sponsorshipScientific and Technological Research Council of Turkey (TÜBİTAK)
dc.description.versionPublisher version
dc.identifier.doi10.1117/12.821198
dc.identifier.embargoNO
dc.identifier.filenameinventorynoIR01010
dc.identifier.isbn9780819476401
dc.identifier.issn0277-786X
dc.identifier.quartileN/A
dc.identifier.scopus2-s2.0-70349980734
dc.identifier.urihttps://hdl.handle.net/20.500.14288/2825
dc.identifier.wos165198500009
dc.keywordsMicrospheres
dc.keywordsMorphology dependent resonances
dc.keywordsRCE photodetector
dc.keywordsSilicon
dc.language.isoeng
dc.publisherSociety of Photo-optical Instrumentation Engineers (SPIE)
dc.relation.grantnoFP6-IST-003887 NEMO
dc.relation.grantnoFP6-IST-511616 PHOREMOST
dc.relation.grantnoEEEAG-106E215
dc.relation.ispartofProceedings of SPIE - The International Society for Optical Engineering
dc.relation.urihttp://cdm21054.contentdm.oclc.org/cdm/ref/collection/IR/id/1013
dc.subjectPhysics
dc.titleNear-infrared resonant cavity enhanced silicon microsphere photodetector
dc.typeConference Proceeding
dspace.entity.typePublication
local.contributor.kuauthorSerpengüzel, Ali
local.publication.orgunit1College of Sciences
local.publication.orgunit2Department of Physics
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