<link rel="stylesheet" href="styles.f3b1fba60ec7970c.css">

Publication:
Terahertz wavefront engineering using a hard-coded metasurface

Loading...
Thumbnail Image

Departments

Item type:Organizational Unit,

School / College / Institute

Item type:Organizational Unit,

Program

KU-Authors

Organization Authors

Co-Authors

Noori, Aileen

Akyurek, Bora

Demirhan, Yasemin

Ozyuzer, Lutfi

Altan, Hakan

Aygun, Gulnur

Date

Language

Embargo Status

N/A

Journal Title

Journal ISSN

Volume Title

Alternative Title

Abstract

During the past few years, coding metamaterials (MM) drew significant attention, where the far-field scattering/transmission pattern of the electromagnetic wave (particularly in the THz regime) can be encoded into a single or few-bit digitized phase-response of the metasurface, thereby enabling a full digital control. Single-bit MMs contain two types of unit cells where the phase becomes 0 and 1 (in units of pi ), respectively. By arranging these unit cells into a 2D surface pattern, the THz wavefront can be shaped. In this work, a novel hard-coded metasurface was designed, fabricated, and experimentally investigated for multi-beam reflection of incident THz beam. The design employs stripe and checkerboard patterns of bilayer MM unit cells consisting of square gold patches with a polymer spacing layer from a gold backplane. Experimental and simulation results show that the incident wave in the 0.500-0.750 THz range can be reflected with > 95% efficiency in uniform amplitude and 1-bit coded phase. For the checkerboard metasurface pattern, the measured and analytically calculated reflection angle shows good agreement. The metasurface design is suitable for large-scale fabrication and can potentially be used as a template in the development of actively coded metasurfaces.

Source

Publisher

Springer

Citation

item.page.haspartof

Source

Optical and Quantum Electronics

item.page.ispartofseries

item.page.edition

DOI

10.1007/s11082-023-04955-x

item.page.datauri

item.page.link

Rights

N/A

Copyrights Note

Rights and licensing

N/A

Endorsement

Review

Supplemented By

Referenced By

Related Patent

Related Goal

Google Scholar
Scholar'da Ara ↗
5
Görüntülenme
0
İndirme
Altmetric
Dimensions
PlumX Metrikleri
BIP! Indicators