Researcher:
Günev, İhsan

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Master Student

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İhsan

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Günev

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Günev, İhsan

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2006 - 20083

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Researcher Of Publications: search.filters.isAuthorOfPublication.aab4d5f4-2b08-4875-a8ac-765a76d8f297

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Now showing 1 - 3 of 3
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    A virtual reality toolkit for path planning and manipulation at nano-scale
    (IEEE Computer Soc, 2006) N/A; N/A; Department of Mechanical Engineering; Varol, Aydın; Günev, İhsan; Başdoğan, Çağatay; Master Student; Master Student; Faculty Member; Department of Mechanical Engineering; Graduate School of Sciences and Engineering; Graduate School of Sciences and Engineering; College of Engineering; N/A; N/A; 125489
    A virtual reality (VR) toolkit that integrates the human operator into a virtual environment by means of visual and haptic feedback has been developed to design and test manipulation strategies at nano-scale. Currently, the toolkit is capable of modeling the mechanistic interactions between an AFM tip and spherical particles on a substrate surface and generating optimum manipulation paths using a potential field approach. In addition, haptic fixtures were designed to guide the user to follow the calculated paths.
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    Numerical simulation of nano scanning in intermittent-contact mode afm under Q control
    (Iop Publishing Ltd, 2008) N/A; N/A; N/A; Department of Mechanical Engineering; Varol, Aydın; Günev, İhsan; Örün, Bilal; Başdoğan, Çağatay; Master Student; Master Student; Master Student; Faculty Member; Department of Mechanical Engineering; Graduate School of Sciences and Engineering; Graduate School of Sciences and Engineering; Graduate School of Sciences and Engineering; College of Engineering; N/A; N/A; N/A; 125489
    We investigate nano scanning in tapping mode atomic force microscopy (aFM) under quality (Q) control via numerical simulations performed in SIMULinK. We focus on the simulation of the whole scan process rather than the simulation of cantilever dynamics and the force interactions between the probe tip and the surface alone, As in most of the earlier numerical studies. This enables us to quantify the scan performance under Q control for different scan settings. Using the numerical simulations, we first investigate the effect of the elastic modulus of the sample (relative to the substrate surface) and probe stiffness on the scan results. Our numerical simulations show that scanning in an attractive regime using soft cantilevers with high effective Q factor (Q(eff)) results in a better image quality. We then demonstrate the trade-off in setting Q(eff) of the probe in Q control: low values of Q(eff) cause an increase in tapping forces while higher ones limit the maximum achievable scan speed due to the slow response of the cantilever to the rapid changes in surface profile. Finally, we show that it is possible to achieve higher scan speeds without causing an increase in the tapping forces using adaptive Q control (aQC), in which the Q factor of the probe is changed instantaneously depending on the magnitude of the error signal in oscillation amplitude. the scan performance of aQC is quantitatively compared to that of standard Q control using iso-error curves obtained from numerical simulations first and then the results are validated through scan experiments performed using a physical set-up.
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    PublicationOpen Access
    Adaptive Q control for tapping-mode nanoscanning using a piezoactuated bimorph probe
    (American Institute of Physics (AIP) Publishing, 2007) Department of Mechanical Engineering; Günev, İhsan; Varol, Aydın; Karaman, Sertaç; Başdoğan, Çağatay; Master Student; Faculty Member; Department of Mechanical Engineering; College of Engineering; N/A; N/A; N/A; 125489
    A new approach, called adaptive Q control, for tapping-mode atomic force microscopy (AFM) is introduced and implemented on a homemade AFM setup utilizing a laser Doppler vibrometer and a piezoactuated bimorph probe. In standard Q control, the effective Q factor of the scanning probe is adjusted prior to the scanning depending on the application. However, there is a trade-off in setting the effective Q factor of an AFM probe. The Q factor is either increased to reduce the tapping forces or decreased to increase the maximum achievable scan speed. Realizing these two benefits simultaneously using standard Q control is not possible. In adaptive Q control, the Q factor of the probe is set to an initial value as in standard Q control, but then modified on the fly during scanning when necessary to achieve this goal. In this article, we present the basic theory behind adaptive Q control, the electronics enabling the online modification of the probe's effective Q factor, and the results of the experiments comparing three different methods: scanning (a) without Q control, (b) with standard Q control, and (c) with adaptive Q control. The results show that the performance of adaptive Q control is superior to the other two methods.